Thursday 17 December; Delft, Neil Curson ' STM studies of dopants in silicon for COMPASSS'



Time: 13:00 hrs

Location: Room G

 Dr Neil J Curson, London Centre for Nanotechnology, UCL, UK.

STM studies of dopants in silicon for COMPASSS (Coherent Optical and  Microwave Physics for Atomic-Scale Spintronics in Silicon)

COMPASSS is a new five year project to study coherent optical and  microwave physics for atomic-scale spintronics in silicon. Based at  the London Centre for Nanotechnology, Surrey University and the FELIX  free electron laser source near Utrecht, the project spans the fields  of nanoscale device fabrication, scanning probe microscopy, modelling,  and microwave and THz spectroscopy. The primary goal of the programme  is to develop single impurity-derived devices in silicon with  functions based on principles from atomic physics – namely those of  long-lived quantum states and interactions between them and radiation  fields. In this talk I will introduce the COMPASSS project and discuss  the issues related to the fabrication of atomic-scale devices and  their study with scanning tunnelling microscopy (STM) based  spectroscopic measurements. Initial characterisation of dopant  impurities in silicon is taking place using ion implanted samples and  preliminary results demonstrate that cross- section STM is an  invaluable tool for the characterisation of such samples, with bismuth  implanted in silicon as an example.