Clever Delft trick enables 20 times faster imaging with electron microscopy


Researchers at TU Delft have expanded upon a clever trick, thereby increasing the speed of electron microscope imaging by a factor of twenty. A simple adjustment is all that is needed: applying a voltage to the specimen holder. Through this simple intervention, a specimen that would normally take an electron microscope a week to image can now be inspected in a single night or one working day. Read more

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