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From imaging to analysing: how Delmic’s new FAST-EM system is changing electron microscopy

[30-11-2020]

Applied Sciences spin-off Delmic is launching an automated ultra-fast system, FAST-EM, which uses 64 electron beams. Reliable and extremely fast, FAST-EM is aimed at imaging biological samples without the need to constantly babysit the machine. Read the article

Workshops

12 - 13 October 2022

Grant Application Courselink