PhD position: Electron Microscopy characterization and related techniques of Topological Insulators heterostructures

We are looking for a PhD student to carry out structural and spectroscopy characterization of TIs based heterostructures by means of TEM and related techniques. The aim of the research project is to fully characterize and unravel the structural, chemical and electric properties in dependence of the interfaces morphologies in these heterostructures. Our measurements will be backed up with theoretical analysis and simulations to validate the TEM measurements and improve our understanding of the physical properties of the materials studied. The research will be performed using state-of-the-art electron microscopes both at TU Delft and at international research institutions.

Applicants should have a MSc degree prior to the employment, in physics, chemistry, material science or related fields.

To apply, please send your CV, a motivation letter to

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